Consonant identification using temporal fine structure and recovered envelope cues
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Braida_Consonant identification.pdf
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1.08 MB
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Author(s)
Swaminathan, Jayaganesh
Reed, Charlotte M.
Desloge, Joseph G.
Braida, Louis D.
Delhorne, Lorraine A.
Date Issued
April 2014
Journal
The Journal of the Acoustical Society of America
Publisher
Acoustical Society of America (ASA)
Citation
Swaminathan, Jayaganesh, Charlotte M. Reed, Joseph G. Desloge, Louis D. Braida, and Lorraine A. Delhorne. “Consonant Identification Using Temporal Fine Structure and Recovered Envelope Cuesa).” J. Acoust. Soc. Am. 135, no. 4 (April 2014): 2078–2090. © 2014 Acoustical Society of America
Version
Final published version
Abstract
The contribution of recovered envelopes (RENVs) to the utilization of temporal-fine structure (TFS) speech cues was examined in normal-hearing listeners. Consonant identification experiments used speech stimuli processed to present TFS or RENV cues. Experiment 1 examined the effects of exposure and presentation order using 16-band TFS speech and 40-band RENV speech recovered from 16-band TFS speech. Prior exposure to TFS speech aided in the reception of RENV speech. Performance on the two conditions was similar (∼50%-correct) for experienced listeners as was the pattern of consonant confusions. Experiment 2 examined the effect of varying the number of RENV bands recovered from 16-band TFS speech. Mean identification scores decreased as the number of RENV bands decreased from 40 to 8 and were only slightly above chance levels for 16 and 8 bands. Experiment 3 examined the effect of varying the number of bands in the TFS speech from which 40-band RENV speech was constructed. Performance fell from 85%- to 31%-correct as the number of TFS bands increased from 1 to 32. Overall, these results suggest that the interpretation of previous studies that have used TFS speech may have been confounded with the presence of RENVs.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Massachusetts Institute of Technology. Research Laboratory of Electronics
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DOI of Published Version
https://doi.org/10.1121/1.4865920
