Reconstructing phonon mean-free-path contributions to thermal conductivity using nanoscale membranes
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PhysRevB.91.245423.pdf
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Author(s) • • • • • • • • •
Cuffe, John
Collins, Kimberlee C.
Shchepetov, Andrey
Prunnila, Mika
Ahopelto, Jouni
Sotomayor Torres, Clivia M.
Chen, Gang
Eliason, Jeffrey Kristian
Maznev, Alexei
Johnson, Jeremiah A.
Date Issued
June 2015
Journal
Physical Review B
Publisher
American Physical Society
Citation
Cuffe, John, Jeffrey K. Eliason, A. A. Maznev, Kimberlee C. Collins, Jeremy A. Johnson, Andrey Shchepetov, Mika Prunnila, et al. “Reconstructing Phonon Mean-Free-Path Contributions to Thermal Conductivity Using Nanoscale Membranes.” Phys. Rev. B 91, no. 24 (June 2015). © 2015 American Physical Society
Version
Final published version
Abstract
Knowledge of the mean-free-path distribution of heat-carrying phonons is key to understanding phonon-mediated thermal transport. We demonstrate that thermal conductivity measurements of thin membranes spanning a wide thickness range can be used to characterize how bulk thermal conductivity is distributed over phonon mean free paths. A noncontact transient thermal grating technique was used to measure the thermal conductivity of suspended Si membranes ranging from 15–1500 nm in thickness. A decrease in the thermal conductivity from 74–13% of the bulk value is observed over this thickness range, which is attributed to diffuse phonon boundary scattering. Due to the well-defined relation between the membrane thickness and phonon mean-free-path suppression, combined with the range and accuracy of the measurements, we can reconstruct the bulk thermal conductivity accumulation vs. phonon mean free path, and compare with theoretical models.
MIT Department
Massachusetts Institute of Technology. Department of Chemistry
Massachusetts Institute of Technology. Department of Mechanical Engineering
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DOI of Published Version
https://doi.org/10.1103/PhysRevB.91.245423