Interferometric Deflection Analysis of Suspended 2D Polyaramid Thin Films
Name
Small Methods - 2025 - Quien - Interferometric Deflection Analysis of Suspended 2D Polyaramid Thin Films.pdf
Description
Published version
Size
4.13 MB
Format
Adobe PDF
Checksum (MD5)
536a42504d6404c0d980a9b408619074
Author(s)
Quien, Michelle
Ritt, Cody L
Garimella, Sanjay S
Gress, Hagen
Ekinci, Kamil L
Bunch, Joseph Scott
Strano, Michael S
Date Issued
December 5, 2025
Journal
Small Methods
Publisher
Wiley
Citation
Quien, Michelle, Ritt, Cody L, Garimella, Sanjay S, Gress, Hagen, Ekinci, Kamil L et al. 2025. "Interferometric Deflection Analysis of Suspended 2D Polyaramid Thin Films." Small Methods.
Version
Final published version
Abstract
The 2D nanofilm bulge test, which uses an Atomic Force Microscope (AFM) to measure the deflection of a suspended film under various conditions, has emerged as an important measurement platform for understanding mechanical, barrier, and permeability properties of 2D materials as thickness approaches the angstrom scale. The problem considered in this work is the limitation of such bulge analyses imposed by the AFM whereby dynamic measurements under high pressure, high temperature, and chemically corrosive conditions are limited. In this work, a technique is developed for measuring nanofilm deflection using only visible light interferometry. Both theoretical and semi‐empirical models are applied to translate multicolor interference patterns from broadband excitation into estimates of nano‐film deflection, allowing nanoscale precision in most cases. The technique and algorithm advanced in this work allows the use of widespread optical microscopy to widen the study of these important 2D nanofilm systems to more relevant conditions.
MIT Department
Massachusetts Institute of Technology. Department of Chemical Engineering
Terms of Use
Creative Commons Attribution
Persistent DSpace Link
DOI of Published Version
https://doi.org/10.1002/smtd.202501543
