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Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices

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RLE_PR_130_11.pdf

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Author(s)
Kastner, Marc A.
•
Field, Stuart B.
•
Scott-Thomas, John H. F.
•
Meirav, Udi
•
Park, Samuel L.
Date Issued
1987-01-01 to 1987-12-31
Publisher
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Series/Report no.
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130
Description
Contains project goals.
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Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.
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