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Research Laboratory for Electronics (RLE)
RLE Progress Reports
RLE Progress Report, No. 130 (1987)
Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices
Ultralow-Temperature Measurements of Submicron Devices Nanometer-Scale Semiconductor Devices
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Name
RLE_PR_130_11.pdf
Size
2.05 MB
Format
Adobe PDF
Checksum
(MD5)
891ccf13d6f5f67c3219404468e7671c
Author(s)
Kastner, Marc A.
•
Field, Stuart B.
•
Scott-Thomas, John H. F.
•
Meirav, Udi
•
Park, Samuel L.
Date Issued
1987-01-01 to 1987-12-31
Publisher
Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)
Series/Report no.
Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130
Description
Contains project goals.
Terms of Use
Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.
Persistent DSpace Link
http://hdl.handle.net/1721.1/57016
