An expert system to detect and diagnose failures in DRAM
Name
46888270-MIT.pdf
Description
Full printable version
Size
3.93 MB
Format
Adobe PDF
Checksum (MD5)
d5c762c425eef234c9794fe6d14222d0
Author(s)
Satish, Venkatesh, 1976-
Advisor(s)
Srinivas Devadas.
Alternative Title
Expert system to detect and diagnose failures in dynamic randon-access memory
Date Issued
2000
Publisher
Massachusetts Institute of Technology
Description
Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2000.
Includes bibliographical references (leaves 63-64).
Subjects
Electrical Engineering and Computer Science.
MIT Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Terms of Use
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