Pushing phase and amplitude sensitivity limits in interferometric microscopy
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Author(s)
Diaspro, Alberto
Hosseini, Poorya
Zhou, Renjie
Kim, Yang-Hyo
Peres, Chiara
Kuang, Cuifang
Yaqoob, Zahid
So, Peter T. C.
Date Issued
April 2016
Journal
Optics Letters
Publisher
The Optical Society
Citation
Hosseini, Poorya, Renjie Zhou, Yang-Hyo Kim, Chiara Peres, Alberto Diaspro, Cuifang Kuang, Zahid Yaqoob, and Peter T. C. So. “Pushing Phase and Amplitude Sensitivity Limits in Interferometric Microscopy.” Optics Letters 41, no. 7 (April 1, 2016): 1656.
Version
Author's final manuscript
Abstract
Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer.
MIT Department
Massachusetts Institute of Technology. Department of Biological Engineering
Massachusetts Institute of Technology. Department of Chemistry
Massachusetts Institute of Technology. Department of Mechanical Engineering
Massachusetts Institute of Technology. Laser Biomedical Research Center
Massachusetts Institute of Technology. Biological Engineering Accelerator Mass Spectrometry Lab
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Creative Commons Attribution-Noncommercial-Share Alike
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DOI of Published Version
https://doi.org/10.1364/OL.41.001656
