dc.contributor.author | Nguyen, Thanh T-H. | |
dc.contributor.author | Mow-Lowry, Conor Malcolm | |
dc.contributor.author | Slagmolen, Bram J. J. | |
dc.contributor.author | Miller, John | |
dc.contributor.author | Mullavey, Adam J. | |
dc.contributor.author | Altin, Paul A. | |
dc.contributor.author | Shaddock, Daniel A. | |
dc.contributor.author | McClelland, David E. | |
dc.contributor.author | Gossler, Stefan | |
dc.date.accessioned | 2015-12-16T14:55:06Z | |
dc.date.available | 2015-12-16T14:55:06Z | |
dc.date.issued | 2015-12 | |
dc.date.submitted | 2015-10 | |
dc.identifier.issn | 1550-7998 | |
dc.identifier.issn | 1550-2368 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/100286 | |
dc.description.abstract | We present measurements of the frequency dependence of thermal noise in aluminum and niobium flexures. Our measurements cover the audio-frequency band from 10 Hz to 10 kHz, which is of particular relevance to ground-based interferometric gravitational wave detectors, and span up to an order of magnitude above and below the fundamental flexure resonances. Results from two flexures are well explained by a simple model in which both structural and thermoelastic loss play a role. The ability of such a model to explain this interplay is important for investigations of quantum-radiation-pressure noise and the standard quantum limit. Furthermore, measurements on a third flexure provide evidence that surface damage can affect the frequency dependence of thermal noise in addition to reducing the quality factor, a result which will aid the understanding of how aging effects impact on thermal noise behavior. | en_US |
dc.description.sponsorship | Australian Research Council | en_US |
dc.publisher | American Physical Society | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1103/PhysRevD.92.112004 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | American Physical Society | en_US |
dc.title | Frequency dependence of thermal noise in gram-scale cantilever flexures | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Nguyen, Thanh T-H., et al. "Frequency dependence of thermal noise in gram-scale cantilever flexures." Phys. Rev. D 92, 112004 (December 2015). © 2015 American Physical Society | en_US |
dc.contributor.department | MIT Kavli Institute for Astrophysics and Space Research | en_US |
dc.audience.educationlevel | | |
dc.contributor.mitauthor | Miller, John | en_US |
dc.relation.journal | Physical Review D | en_US |
dc.eprint.version | Final published version | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dc.date.updated | 2015-12-15T23:00:07Z | |
dc.language.rfc3066 | en | |
dc.rights.holder | American Physical Society | |
dspace.orderedauthors | Nguyen, Thanh T-H.; Mow-Lowry, Conor M.; Slagmolen, Bram J. J.; Miller, John; Mullavey, Adam J.; Gossler, Stefan; Altin, Paul A.; Shaddock, Daniel A.; McClelland, David E. | en_US |
mit.license | PUBLISHER_POLICY | en_US |
mit.metadata.status | Complete | |