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dc.contributor.authorPrins, Ferry
dc.contributor.authorTisdale, William A.
dc.contributor.authorGoodman, Aaron Jacob
dc.date.accessioned2016-02-29T17:45:38Z
dc.date.available2016-02-29T17:45:38Z
dc.date.issued2014-10
dc.date.submitted2014-09
dc.identifier.issn1530-6984
dc.identifier.issn1530-6992
dc.identifier.urihttp://hdl.handle.net/1721.1/101378
dc.description.abstractWe report highly efficient nonradiative energy transfer from cadmium selenide (CdSe) quantum dots to monolayer and few-layer molybdenum disulfide (MoS[subscript 2]). The quenching of the donor quantum dot photoluminescence increases as the MoS[subscript 2] flake thickness decreases with the highest efficiency (>95%) observed for monolayer MoS[subscript 2]. This counterintuitive result arises from reduced dielectric screening in thin layer semiconductors having unusually large permittivity and a strong in-plane transition dipole moment, as found in MoS[subscript 2]. Excitonic energy transfer between a zero-dimensional emitter and a two-dimensional absorber is fundamentally interesting and enables a wide range of applications including broadband optical down-conversion, optical detection, photovoltaic sensitization, and color shifting in light-emitting devices.en_US
dc.description.sponsorshipUnited States. Dept. of Energy. Office of Basic Energy Sciences (Award DE-SC0001088)en_US
dc.language.isoen_US
dc.publisherAmerican Chemical Society (ACS)en_US
dc.relation.isversionofhttp://dx.doi.org/10.1021/nl5019386en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourcearXiven_US
dc.titleReduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2]en_US
dc.typeArticleen_US
dc.identifier.citationPrins, Ferry, Aaron J. Goodman, and William A. Tisdale. “Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2].” Nano Lett. 14, no. 11 (November 12, 2014): 6087–6091.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistryen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorPrins, Ferryen_US
dc.contributor.mitauthorGoodman, Aaron Jacoben_US
dc.contributor.mitauthorTisdale, William A.en_US
dc.relation.journalNano Lettersen_US
dc.eprint.versionOriginal manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsPrins, Ferry; Goodman, Aaron J.; Tisdale, William A.en_US
dc.identifier.orcidhttps://orcid.org/0000-0002-6615-5342
dc.identifier.orcidhttps://orcid.org/0000-0002-0159-5646
mit.licensePUBLISHER_POLICYen_US


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