dc.contributor.author | Prins, Ferry | |
dc.contributor.author | Tisdale, William A. | |
dc.contributor.author | Goodman, Aaron Jacob | |
dc.date.accessioned | 2016-02-29T17:45:38Z | |
dc.date.available | 2016-02-29T17:45:38Z | |
dc.date.issued | 2014-10 | |
dc.date.submitted | 2014-09 | |
dc.identifier.issn | 1530-6984 | |
dc.identifier.issn | 1530-6992 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/101378 | |
dc.description.abstract | We report highly efficient nonradiative energy transfer from cadmium selenide (CdSe) quantum dots to monolayer and few-layer molybdenum disulfide (MoS[subscript 2]). The quenching of the donor quantum dot photoluminescence increases as the MoS[subscript 2] flake thickness decreases with the highest efficiency (>95%) observed for monolayer MoS[subscript 2]. This counterintuitive result arises from reduced dielectric screening in thin layer semiconductors having unusually large permittivity and a strong in-plane transition dipole moment, as found in MoS[subscript 2]. Excitonic energy transfer between a zero-dimensional emitter and a two-dimensional absorber is fundamentally interesting and enables a wide range of applications including broadband optical down-conversion, optical detection, photovoltaic sensitization, and color shifting in light-emitting devices. | en_US |
dc.description.sponsorship | United States. Dept. of Energy. Office of Basic Energy Sciences (Award DE-SC0001088) | en_US |
dc.language.iso | en_US | |
dc.publisher | American Chemical Society (ACS) | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1021/nl5019386 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | arXiv | en_US |
dc.title | Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2] | en_US |
dc.type | Article | en_US |
dc.identifier.citation | Prins, Ferry, Aaron J. Goodman, and William A. Tisdale. “Reduced Dielectric Screening and Enhanced Energy Transfer in Single- and Few-Layer MoS[subscript 2].” Nano Lett. 14, no. 11 (November 12, 2014): 6087–6091. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Chemical Engineering | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Research Laboratory of Electronics | en_US |
dc.contributor.mitauthor | Prins, Ferry | en_US |
dc.contributor.mitauthor | Goodman, Aaron Jacob | en_US |
dc.contributor.mitauthor | Tisdale, William A. | en_US |
dc.relation.journal | Nano Letters | en_US |
dc.eprint.version | Original manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
dspace.orderedauthors | Prins, Ferry; Goodman, Aaron J.; Tisdale, William A. | en_US |
dc.identifier.orcid | https://orcid.org/0000-0002-6615-5342 | |
dc.identifier.orcid | https://orcid.org/0000-0002-0159-5646 | |
mit.license | PUBLISHER_POLICY | en_US |