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Growth and characterization of mismatched indium gallium phosphide films for reduced area dislocation filtering

dc.contributor.advisorEugene A. Fitgerald.en_US
dc.contributor.authorMakan, Sanjeev, 1973-en_US
dc.date.accessioned2005-08-18T23:02:03Z
dc.date.available2005-08-18T23:02:03Z
dc.date.copyright1997en_US
dc.date.issued1997en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/10229
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1997.en_US
dc.descriptionIncludes bibliographical references (leaves 76-76).en_US
dc.description.statementofresponsibilityby Sanjeev Makan.en_US
dc.format.extent77 leavesen_US
dc.format.extent6519398 bytes
dc.format.extent6519156 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMaterials Science and Engineeringen_US
dc.titleGrowth and characterization of mismatched indium gallium phosphide films for reduced area dislocation filteringen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.identifier.oclc38509139en_US


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