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dc.contributor.advisorTommi S. Jaakkola and Cynthia Rudin.en_US
dc.contributor.authorGarg, Vikas, Ph. D. (Vikas Kamur). Massachusetts Institute of Technologyen_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2016-12-05T19:58:28Z
dc.date.available2016-12-05T19:58:28Z
dc.date.copyright2016en_US
dc.date.issued2016en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/105697
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 45-46).en_US
dc.description.abstractIn this thesis, we present a hierarchical Bayesian framework for clustering with cluster-specific feature selection. We derive a simplified model, CRAFT, by analyzing the asymptotic behavior of the log posterior formulations in a nonparametric MAP-based clustering setting in this framework. The model handles assorted data, i.e., both numeric and categorical data, and the underlying objective functions are intuitively appealing. The resulting algorithm is simple to implement and scales nicely, requires minimal parameter tuning, obviates the need to specify the number of clusters a priori, and compares favorably with other state-of-the-art methods on several datasets. We provide empirical evidence on carefully designed synthetic data sets to highlight the robustness of the algorithm to recover the underlying feature subspaces, even when the average dimensionality of the features across clusters is misspecified. Besides, the framework seamlessly allows for multiple views of clustering by interpolating between the two extremes of cluster-specific feature selection and global selection, and recovers the DP-means objective [14] under the degenerate setting of clustering without feature selection.en_US
dc.description.statementofresponsibilityby Vikas Garg.en_US
dc.format.extent46 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleCRAFT : ClusteR-specific Assorted Feature selecTionen_US
dc.title.alternativeClusteR-specific Assorted Feature selecTionen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc964524600en_US


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