dc.contributor.advisor | Harry L. Tuller. | en_US |
dc.contributor.author | Chen, Thomas D. (Thomas Duhwa) | en_US |
dc.date.accessioned | 2005-08-18T15:50:42Z | |
dc.date.available | 2005-08-18T15:50:42Z | |
dc.date.copyright | 1996 | en_US |
dc.date.issued | 1996 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/10997 | |
dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1996. | en_US |
dc.description | Includes bibliographical references (leaves 75-78). | en_US |
dc.description.statementofresponsibility | by Thomas D. Chen. | en_US |
dc.format.extent | 78 leaves | en_US |
dc.format.extent | 6458508 bytes | |
dc.format.extent | 6458265 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Materials Science and Engineering | en_US |
dc.title | Electrically active defects in zinc oxide | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.S. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
dc.identifier.oclc | 35954031 | en_US |