Measurement and modeling of transient effects in partially-depleted SOI MOSFETs
Author(s)
Wei, Andy, 1972-
DownloadFull printable version (5.016Mb)
Advisor
Dimitri A. Antoniadis.
Terms of use
Metadata
Show full item recordDescription
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. Includes bibliographical references (leaves 75-76).
Date issued
1996Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer SciencePublisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science