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Origin of Efficiency Roll-Off in Colloidal Quantum-Dot Light-Emitting Diodes

dc.contributor.authorShirasaki, Yasuhiro
dc.contributor.authorSupran, Geoffrey J
dc.contributor.authorTisdale, William
dc.contributor.authorBulovic, Vladimir
dc.date.accessioned2017-07-19T18:58:08Z
dc.date.available2017-07-19T18:58:08Z
dc.date.issued2013-05
dc.date.submitted2013-02
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.urihttp://hdl.handle.net/1721.1/110780
dc.description.abstractWe study the origin of efficiency roll-off (also called “efficiency droop”) in colloidal quantum-dot light-emitting diodes through the comparison of quantum-dot (QD) electroluminescence and photoluminescence. We find that an electric-field-induced decrease in QD luminescence efficiency—and not charge leakage or QD charging (Auger recombination)—is responsible for the roll-off behavior, and use the quantum confined Stark effect to accurately predict the external quantum efficiency roll-off of QD light-emitting diodes.en_US
dc.description.sponsorshipUnited States. Department of Energy (DE-SC0001088)en_US
dc.language.isoen_US
dc.publisherAmerican Physical Societyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1103/PhysRevLett.110.217403en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceAPSen_US
dc.titleOrigin of Efficiency Roll-Off in Colloidal Quantum-Dot Light-Emitting Diodesen_US
dc.typeArticleen_US
dc.identifier.citationShirasaki, Yasuhiro; Supran, Geoffrey J.; Tisdale, William A. et al. “Origin of Efficiency Roll-Off in Colloidal Quantum-Dot Light-Emitting Diodes.” Physical Review Letters 110, 21 (May 2013): 217403 © 2013 American Physical Societyen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Research Laboratory of Electronicsen_US
dc.contributor.mitauthorShirasaki, Yasuhiro
dc.contributor.mitauthorSupran, Geoffrey J
dc.contributor.mitauthorTisdale, William
dc.contributor.mitauthorBulovic, Vladimir
dc.relation.journalPhysical Review Lettersen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsShirasaki, Yasuhiro; Supran, Geoffrey J.; Tisdale, William A.; Bulović, Vladimiren_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-3846-1633
dc.identifier.orcidhttps://orcid.org/0000-0002-6615-5342
dc.identifier.orcidhttps://orcid.org/0000-0002-0960-2580
mit.licensePUBLISHER_POLICYen_US


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