Superadditivity of Quantum Channel Coding Rate With Finite Blocklength Joint Measurements
Author(s)
Chung, Hye Won; Guha, Saikat; Zheng, Lizhong
DownloadZheng_Superadditivity of.pdf (614.3Kb)
OPEN_ACCESS_POLICY
Open Access Policy
Creative Commons Attribution-Noncommercial-Share Alike
Terms of use
Metadata
Show full item recordAbstract
The maximum rate at which classical information can be reliably transmitted per use of a quantum channel strictly increases in general with N , the number of channel outputs that are detected jointly by the quantum joint-detection receiver (JDR). This phenomenon is known as superadditivity of the maximum achievable information rate over a quantum channel. We study this phenomenon for a pure-state classical-quantum channel and provide a lower bound on C[subscript N]/N, the maximum information rate when the JDR is restricted to making joint measurements over no more than N quantum channel outputs, while allowing arbitrary classical error correction. We also show the appearance of a superadditivity phenomenon-of mathematical resemblance to the aforesaid problem-in the channel capacity of a classical discrete memoryless channel when a concatenated coding scheme is employed, and the inner decoder is forced to make hard decisions on N-length inner codewords. Using this correspondence, we develop a unifying framework for the above two notions of superadditivity, and show that for our lower bound to C[subscript N]/N to be equal to a given fraction of the asymptotic capacity C of the respective channel, N must be proportional to V/C², where V is the respective channel dispersion quantity.
Date issued
2016-10Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer ScienceJournal
IEEE Transactions on Information Theory
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Chung, Hye Won, et al. “Superadditivity of Quantum Channel Coding Rate With Finite Blocklength Joint Measurements.” IEEE Transactions on Information Theory 62, 10 (October 2016): 5938–5959 © 2016 Institute of Electrical and Electronics Engineers (IEEE)
Version: Original manuscript
ISSN
0018-9448
1557-9654