Design and control optimization for high-speed jumping mode Atomic Force Microscope
Massachusetts Institute of Technology. Department of Mechanical Engineering.
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In this thesis, I improved the design of a high-speed Atomic Force Microscope (AFM) for jumping mode operation. The relations between important imaging parameters and physical limitations of the system were established first to identify the aspects of improvement. Two control algorithms to improve the imaging speed and probe sample interaction force for jumping mode atomic force microscopy operation have been proposed and investigated both in simulation and experiment. A new generation of multi-actuated sample scanner has been designed to address the dynamic coupling, thermal expansion and range issues in the previous design. Improvements to the optical beam deflection system, photodiode circuit, signal conditioning circuit and cantilever probe holder with actuators have been implemented. The combined optimization and design work improved the capability of the original custom made high-speed AFM setup in both subsystem performance and jumping mode operation.
Thesis: S.M., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2017.Cataloged from PDF version of thesis.Includes bibliographical references (pages 107-111).
DepartmentMassachusetts Institute of Technology. Department of Mechanical Engineering.
Massachusetts Institute of Technology