A pipelined analog-to-digital converter with low-gain, low-bandwidth op-amps

Abstract

Designing a high-gain, high-bandwidth op-amp for pipelined ADCs in fine-line CMOS technology has become increasingly challenging. In order to address this issue, this thesis presents the shadow-ADC-assisted digital calibration technique. The proposed technique relaxes op-amp performance requirements by removing op-amp-induced charge-transfer errors in the digital domain. A proof-of-concept pipelined ADC has been designed in 28nm FDSOI CMOS technology and is currently being fabricated.