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dc.contributor.advisorKamal Youcef-Toumi.en_US
dc.contributor.authorYu, Jennifer, S.B. Massachusetts Institute of Technologyen_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Mechanical Engineering.en_US
dc.date.accessioned2017-12-05T19:16:57Z
dc.date.available2017-12-05T19:16:57Z
dc.date.copyright2017en_US
dc.date.issued2017en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/112529
dc.descriptionThesis: S.B., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2017.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 71-72).en_US
dc.description.abstractIn this thesis, I present the design and implementation of a novel cantilever probe holder that is capable of tapping mode operation. The probe holder is implemented in a previously designed high-speed, large-range atomic force microscope (AFM). This AFM used a cantilever probe holder that was only capable of contact mode operation, placing limitations on imaging speed and increasing the risk of probe tip damage. Therefore, the focus of this thesis presents the improved design of a cantilever probe holder that actuates and utilizes probe dynamics. This will allow for more flexible and sustainable use of the AFM system. Additionally, two versions of this improved design are developed for operation in air and in liquid. Classical plate theory, finite element analysis (FEA), and non-parametric system identification are used to validate the structure dynamics of the cantilever probe holder.en_US
dc.description.statementofresponsibilityby Jennifer Yu.en_US
dc.format.extent72 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMechanical Engineering.en_US
dc.titleDesign and implementation of cantilever probe holder for tapping mode atomic force microscopyen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc1012939866en_US


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