| dc.contributor.advisor | Henry I. Smith. | en_US |
| dc.contributor.author | Burkhardt, Martin | en_US |
| dc.date.accessioned | 2005-08-17T18:13:14Z | |
| dc.date.available | 2005-08-17T18:13:14Z | |
| dc.date.copyright | 1995 | en_US |
| dc.date.issued | 1995 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/11403 | |
| dc.description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. | en_US |
| dc.description | Includes bibliographical references (p. 163-162). | en_US |
| dc.description.statementofresponsibility | by Martin Burkhardt. | en_US |
| dc.format.extent | 172 p. | en_US |
| dc.format.extent | 11271533 bytes | |
| dc.format.extent | 11271288 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Electrical Engineering and Computer Science | en_US |
| dc.title | Fabrication technology and measurement of coupled quantum dot devices | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 33227001 | en_US |
