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dc.contributor.advisorSang-Heon Shim.en_US
dc.contributor.authorMurphy, Caitlin Anneen_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences.en_US
dc.date.accessioned2018-03-27T14:17:53Z
dc.date.available2018-03-27T14:17:53Z
dc.date.copyright2007en_US
dc.date.issued2007en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/114332
dc.descriptionThesis: S.B., Massachusetts Institute of Technology, Department of Earth, Atmospheric, and Planetary Sciences, 2007.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 40-41).en_US
dc.description.abstractScientists at NASA's Goddard Space Flight Center have developed a Combined X-ray Diffraction/Fluorescence (CXRDF) instrument. CXRDF performs simultaneous chemical and structural analysis of an unprepared sample, making it ideal for planetary mineral identification. In an effort to analyze the effectiveness of CXRDF, samples were chosen from a list of minerals that are important in the debate about the origin of the outcrops at Meridiani Planum on Mars. These samples were run on both CXRDF and a laboratory X-ray diffractometer. The datasets were compared, looking at peak identification, d-spacing resolution, and whether the instruments could definitively identify each sample. CXRDF successfully measured the d-spacings for each mineral, and the chemical analysis data were very valuable. However, for CXRDF to be able to definitively identify minerals, its d-spacing range and resolution will need to be improved, in addition to its data analysis software.en_US
dc.description.statementofresponsibilityby Caitlin A. Murphy.en_US
dc.format.extent41 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectEarth, Atmospheric, and Planetary Sciences.en_US
dc.titleAn analysis of a continuum X-ray Diffraction/Fluorescence instrumenten_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences.en_US
dc.identifier.oclc1028748970en_US


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