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Offset correction techniques for imaging sensors using random dither information

dc.contributor.advisorWilliam C. Karl.en_US
dc.contributor.authorIdeker, Treyen_US
dc.date.accessioned2005-08-17T18:50:09Z
dc.date.available2005-08-17T18:50:09Z
dc.date.copyright1995en_US
dc.date.issued1995en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/11470
dc.descriptionThesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.en_US
dc.descriptionIncludes bibliographical references (p. 192-193).en_US
dc.description.statementofresponsibilityby Trey Ideker.en_US
dc.format.extent193 p.en_US
dc.format.extent14292557 bytes
dc.format.extent14292315 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Scienceen_US
dc.titleOffset correction techniques for imaging sensors using random dither informationen_US
dc.typeThesisen_US
dc.description.degreeM.Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc33353311en_US


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