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dc.contributor.authorCarrasco, Marine
dc.contributor.authorGonçalves, Silvia
dc.contributor.authorRenault, Eric
dc.contributor.authorChernozhukov, Victor V
dc.date.accessioned2018-05-10T14:45:56Z
dc.date.available2018-05-10T14:45:56Z
dc.date.issued2015-03
dc.identifier.issn0304-4076
dc.identifier.urihttp://hdl.handle.net/1721.1/115289
dc.description.abstractThe technological innovations in information processing and the increased storage capability have made possible to collect very large data sets in various fields of economics and finance. Researchers, companies, and governments look for ways to exploit this rich information. This special issue collects 11 papers who present state-of-the-art techniques to deal with many predictors, many regressors or many instruments. It grew out of the CIREQ conference on high dimensional models in econometrics organized by Marine Carrasco and Sílvia Gonçalves in Montreal, Canada, on May 4–5, 2012.en_US
dc.language.isoen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/J.JECONOM.2015.02.009en_US
dc.rightsCreative Commons Attribution-Noncommercial-NoDerivativesen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceChernozhukoven_US
dc.titleHigh dimensional problems in econometricsen_US
dc.typeArticleen_US
dc.identifier.citationCarrasco, Marine et al.“High Dimensional Problems in Econometrics.” Journal of Econometrics 186, 2 (June 2015): 277–279 © 2015 Elsevier B.V.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Economicsen_US
dc.contributor.approverChernozhukov, Victoren_US
dc.contributor.mitauthorChernozhukov, Victor V
dc.relation.journalJournal of Econometricsen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dspace.orderedauthorsCarrasco, Marine; Chernozhukov, Victor; Gonçalves, Silvia; Renault, Ericen_US
dspace.embargo.termsNen_US
dc.identifier.orcidhttps://orcid.org/0000-0002-3250-6714
mit.licensePUBLISHER_CCen_US


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