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dc.contributor.advisorKarl K. Berggren.en_US
dc.contributor.authorTurchetti, Marco.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2019-07-17T20:59:55Z
dc.date.available2019-07-17T20:59:55Z
dc.date.copyright2019en_US
dc.date.issued2019en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/121744
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2019en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 103-108).en_US
dc.description.abstractIn this thesis, the different electron optical components necessary to build a linear cavity for multi-pass transmission electron microscopy are analyzed and simulated. Moreover, a prototype of the core component, the gated mirror, was designed and some preliminary experimental testings were carried out to asses its optical properties. Then, an architecture of the complete linear cavity, including the correction of spherical aberration and image rotation was designed, optimized and validated through simulation. Finally, an experimental setup for the characterization of electron optical elements was also designed, implemented and experimentally tested. Such a diagnostics setup is going to be adopted for the verification of the multi-pass components optical properties, performance, and their agreement to the design specifications.en_US
dc.description.statementofresponsibilityby Marco Turchetti.en_US
dc.format.extent108 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleDesign of a linear cavity and a characterization setup for multi-pass transmission electron microscopyen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1102051291en_US
dc.description.collectionS.M. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2019-07-17T20:59:53Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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