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dc.contributor.advisorLee Grodzins.en_US
dc.contributor.authorBoisseau, Paul.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Physics.en_US
dc.date.accessioned2019-07-23T19:50:27Z
dc.date.available2019-07-23T19:50:27Z
dc.date.copyright1986en_US
dc.date.issued1986en_US
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Physics, 1986.en_US
dc.descriptionBibliography: leaves 10-11.en_US
dc.description.statementofresponsibilityby Paul Boisseau.en_US
dc.format.extent122 leavesen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleDetermination of three dimensional trace element distributions by the use of monochromatic x-ray microbeamsen_US
dc.typeThesisen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.identifier.oclc14925433en_US
dc.description.collectionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Physics, 1986.en_US
dspace.imported2019-09-04T20:57:32Zen_US


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