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dc.contributor.advisorDirk R. Englund.en_US
dc.contributor.authorPanuski, Christopher Louis.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2019-11-04T20:23:10Z
dc.date.available2019-11-04T20:23:10Z
dc.date.copyright2019en_US
dc.date.issued2019en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/122764
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2019en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 54-56).en_US
dc.description.abstractThe free-carrier dispersion effect - which is resonantly enhanced by a cavity's quality factor to mode volume ratio Q/V[subscript eff] - enables ultrafast, energy-efficient, all-optical control of semiconductor resonators. When applied to recently developed photonic crystal cavities with record-high Q/V[subscript eff] values, this enhanced light-matter interaction unveils new possibilities in nonlinear optics. Here, by considering the free-carrier dispersion effect at the limit of a single photoexcited charge carrier pair, we analyze the possibility of realizing room-temperature, all-optical single photon detection.en_US
dc.description.statementofresponsibilityby Christopher Louis Panuski.en_US
dc.format.extent56 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleCavity-assisted all-optical photodetectionen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1124926290en_US
dc.description.collectionS.M. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2019-11-04T20:23:09Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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