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Interferometric techniques for detecting axion dark matter

dc.contributor.advisorMatthew J. Evans.en_US
dc.contributor.authorElwood, Brodi D.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Physics.en_US
dc.date.accessioned2020-01-08T19:41:15Z
dc.date.available2020-01-08T19:41:15Z
dc.date.copyright2019en_US
dc.date.issued2019en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/123393
dc.descriptionThesis: S.B., Massachusetts Institute of Technology, Department of Physics, 2019en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 59-62).en_US
dc.description.statementofresponsibilityby Brodi D. Elwood.en_US
dc.format.extent62 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleInterferometric techniques for detecting axion dark matteren_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.identifier.oclc1132292855en_US
dc.description.collectionS.B. Massachusetts Institute of Technology, Department of Physicsen_US
dspace.imported2020-01-08T19:41:15Zen_US
mit.thesis.degreeBacheloren_US
mit.thesis.departmentPhysen_US


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