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dc.contributor.advisorHae-Seung Lee.en_US
dc.contributor.authorYang, Xi,Ph. D.Massachusetts Institute of Technology.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-03-09T18:53:23Z
dc.date.available2020-03-09T18:53:23Z
dc.date.copyright2019en_US
dc.date.issued2019en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/124097
dc.descriptionThesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2019en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 107-116).en_US
dc.description.abstractHigh-speed medium-resolution flash analog-to-digital converters (ADCs) are in high demand in today's wireless and wireline systems. Conventional flash ADCs suffer from limited resolution and high power consumption. This thesis investigates time-based techniques that enhance the performance of a flash ADC at giga-sample-per-second (GS/s) sampling rate. Two major design challenges are addressed in this thesis. The first challenge is the ever-growing comparator offset with the scaling of CMOS technology. Conventional offset calibration methods utilize digitally-controlled capacitor banks or an additional input pair. The disadvantages include slower speed due to the added parasitic capacitance or higher input referred noise due to the extra input transistors. In this thesis, we propose an offset calibration method based on timing skew. The proposed method does not add any extra load to the comparator, avoiding the penalties of conventional methods. The second challenge is the exponentially growing number of comparators with resolution. This thesis proposes a time-based 4x interpolation technique that utilizes the timing information from adjacent comparators to resolve two extra bits of resolution without adding comparators. The number of comparators is reduced to 1/4 of a conventional flash ADC, and calibration capability is provided to achieve an 8-bit accuracy. Both techniques are demonstrated on a prototype flash ADC chip that measures state-of-the-art performances.en_US
dc.description.statementofresponsibilityby Xi Yang.en_US
dc.format.extent116 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses are protected by copyright. They may be viewed, downloaded, or printed from this source but further reproduction or distribution in any format is prohibited without written permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleFlash analog-to-digital converters with time-based techniquesen_US
dc.typeThesisen_US
dc.description.degreePh. D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1142634120en_US
dc.description.collectionPh.D. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-03-09T18:53:21Zen_US
mit.thesis.degreeDoctoralen_US
mit.thesis.departmentEECSen_US


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