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dc.contributor.advisorCarl Thompson and Joseph Checkelsky.en_US
dc.contributor.authorMills, Brian(Brian A.)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Physics.en_US
dc.date.accessioned2020-09-03T17:46:55Z
dc.date.available2020-09-03T17:46:55Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/127099
dc.descriptionThesis: S.B., Massachusetts Institute of Technology, Department of Physics, 2020en_US
dc.descriptionCataloged from the official PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 35-39).en_US
dc.description.abstractAbstract Thin Film Li-ion batteries (TFB) are seen as a promising candidate for powering small, low power microelectronic devices as they exhibit high energy density and can operate reliably at low voltages. Currently the biggest obstacle to TFB battery development is high volume expansion and material degradation in electrodes with high theoretical Li ion capacities. Among these materials is RuO₂, which exhibits excellent capacity and great potential for use as either cathode or anode in low power electronics. In order to better understand the mechanisms that underlie mechanical failure in RuO₂, we perform the first in situ measurement of mechanical stress evolution in thin film RuO₂ electrodes. The results of these measurement reveal a very unique stress evolution pattern in RuO₂, which has not been observed or modeled in any previous experiment, exhibiting near zero stress delithiation and linear increase in stress during lithiation. These results point to a mode of failure of RuO₂ which does not occur in other materials currently being studied.en_US
dc.description.statementofresponsibilityby Brian Mills.en_US
dc.format.extent39 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleStress evolution of thin film RuO₂ Li-ion battery electrodesen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.identifier.oclc1191824456en_US
dc.description.collectionS.B. Massachusetts Institute of Technology, Department of Physicsen_US
dspace.imported2020-09-03T17:46:54Zen_US
mit.thesis.degreeBacheloren_US
mit.thesis.departmentPhysen_US


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