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dc.contributor.advisorDevavrat Shah and Gabriel Collin.en_US
dc.contributor.authorHeyer, John(John D.)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-09-15T21:56:22Z
dc.date.available2020-09-15T21:56:22Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/127407
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020en_US
dc.descriptionCataloged from the official PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 67-68).en_US
dc.description.abstractAn important task in astronomy is in locating astronomical objects, known as sources, in images and describing the sources' properties such as size, spatial information, intensity, and color. This task is known as cataloging, and suffers from several shortcomings such as an inability to capture sources fainter than the background, or correctly modeling sources that overlap in what's known as a crowded field. Probabilistic cataloging is a technique based on Bayesian inference that allows sampling from the posterior distribution of catalogs, producing a set of valid hypotheses rather than one, allowing for robust calculations of uncertainty. In this work, we propose methods to produce a probabilistic catalog of the X-ray sky observed by the NuSTAR X-ray telescope.en_US
dc.description.statementofresponsibilityby John Heyer.en_US
dc.format.extent68 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleInference of point sources from NuSTAR X-ray observations using probabilistic catalogingen_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1192560746en_US
dc.description.collectionM.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-09-15T21:56:21Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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