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dc.contributor.advisorPeter Szolovits.en_US
dc.contributor.authorMin, So Yeon,S.M.Massachusetts Institute of Technology.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-09-15T21:59:06Z
dc.date.available2020-09-15T21:59:06Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/127462
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020en_US
dc.descriptionCataloged from the official PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 63-68).en_US
dc.description.abstractCurrent question answering systems face two major challenges; the ability to employ external knowledge and to robustly generalize to unseen expressions of questions need to be improved. In this thesis, I introduce two works that can together help advance question answering. First, I introduce TransINT, a novel and interpretable knowledge graph embedding method that isomorphically preserves the implication ordering among relations in the embedding space. Second, I present methods to train sequence-to-sequence semantic parsing models robust to unseen paraphrases. These two works could together serve as steps to create human-like question answering systems that can understand unseen paraphrases and link existing and external facts for logical inference.en_US
dc.description.statementofresponsibilityby So Yeon Min.en_US
dc.format.extent68 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleTowards knowledge-based, robust question answeringen_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1192966860en_US
dc.description.collectionM.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-09-15T21:59:05Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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