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dc.contributor.advisorRonitt Rubinfeld.en_US
dc.contributor.authorRavichandran, Kavya.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-09-15T22:01:30Z
dc.date.available2020-09-15T22:01:30Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/127508
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020en_US
dc.descriptionCataloged from the official PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 41-42).en_US
dc.description.abstractEfficiently testing whether distributions have certain properties is a problem important in many different disciplines. We seek to understand how many elements appear infrequently, that is, characterize the tail of the distribution. In particular, we develop an algorithm that determines whether the weight of the tail of a distribution is heavy (such as a Lomax) or exponential. Our algorithm makes use of an equal weight bucketing scheme that divides the support of the distribution according to how much probability mass lies between two points, allowing us to characterize parts of the distribution we may not see many samples from. We analyze the sample complexity of our test statistic.en_US
dc.description.statementofresponsibilityby Kavya Ravichandran.en_US
dc.format.extent42 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleAn algorithm for testing heavy-tailed distributionsen_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1193028613en_US
dc.description.collectionM.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-09-15T22:01:30Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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