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dc.contributor.advisorRandall Davis and Dana L. Penney.en_US
dc.contributor.authorSarkar, Sarbari.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-09-15T22:01:55Z
dc.date.available2020-09-15T22:01:55Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/127519
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, May, 2020en_US
dc.descriptionCataloged from the official PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (page 53).en_US
dc.description.abstractNeurodegenerative diseases degrade the mental and physical capabilities of afflicted individuals around the world. Early diagnosis can make it possible to reduce the effects and progression of these diseases. The novel digital Symbol Digit Test (dSDT) is a new cognitive test that judges patterns of recall and cognitive associations, which can be used to differentiate between cognitive signs displayed by normal and neurologically impaired subjects. Our research identifies different strategies of learning and recall, and automates the process of analyzing the eye-tracking data collected from the dSDT to detect these patterns. This work paves the foundation for future studies to assess differences between healthy and impaired individuals, and model these features to detect and aid in the diagnosis of cognitive states of individuals.en_US
dc.description.statementofresponsibilityby Sarbari Sarkar.en_US
dc.format.extent53 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleGaze-tracking analysis for cognitive screening and assessmenten_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1193029297en_US
dc.description.collectionM.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-09-15T22:01:54Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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