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dc.contributor.advisorSteven G. Johnson.en_US
dc.contributor.authorYao, Wenjie(Electrical and computer science engineer)Massachusetts Institute of Technology.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2020-11-03T20:32:15Z
dc.date.available2020-11-03T20:32:15Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/128348
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, February, 2020en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 57-62).en_US
dc.description.abstractFundamental limits to optical responses such as absorption, scattering and local density of states (LDOS) are proposed given intrinsic material losses by Owen, etc. The absorption and scattering limits are validated in Owen's work while the LDOS of common structures fall short of the limits. To validate those theoretical limits in LDOS, comprehensive studies are conducted in the metallic cavity structures, as typical resonant cavities will produce high LDOS. A novel shape optimization method based on the adjoint method is presented in this work, several numerical methods (BEM, CGAL, etc.) and optimization methods are implemented to enable more efficient evaluation and reduce the computation costs.en_US
dc.description.statementofresponsibilityby Wenjie Yao.en_US
dc.format.extent62 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleFundamental limits to local density of states in absorptive systemen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1202001376en_US
dc.description.collectionS.M. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2020-11-03T20:32:14Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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