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dc.contributor.advisorScott Stem.en_US
dc.contributor.authorRaymond, Lindsey Rebecca.en_US
dc.contributor.otherSloan School of Management.en_US
dc.date.accessioned2020-11-23T19:56:12Z
dc.date.available2020-11-23T19:56:12Z
dc.date.copyright2019en_US
dc.date.issued2019en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/128608
dc.descriptionThesis: S.M. in Management Research, Massachusetts Institute of Technology, Sloan School of Management, September, 2019en_US
dc.descriptionCataloged from PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 36-41).en_US
dc.description.abstractWhile patent citations are a common way to measure innovative output, their use as a measure of invention quality involves a paradox. How can we use an ex-post measure of impact (the number of received citations) to identify the ex-ante quality of a given innovation? This paper proposes a novel method of measuring patent quality using patent text and sections of the patent citation distribution with the highest signal to noise ratio. We provide empirical evidence that the bias from using citations to measure quality varies by location in the patent distribution and, contrary to what one might expect, superstar patents are the most predictable while patents in the middle of the distribution are most contaminated with noise. We show predictability of patents increases monotonically over the patent distribution - with the most valuable being the most predictable - and removing the middle of the distribution has little impact on accuracy. We also provide suggestive evidence on the importance of patent text in measuring quality and conclude with suggestive geometric evidence we are capturing differences in underlying patent characteristics. As our model demonstrates, our empirical results generalize to other situations involving highly skewed processes observed with noise. This paper also has implications for empirical work using citation weighted metrics.en_US
dc.description.statementofresponsibilityby Lindsey Rebecca Raymonden_US
dc.format.extent41 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectSloan School of Management.en_US
dc.titlePredicting the obvious : a machine learning approach to superstar inventionsen_US
dc.title.alternativeMachine learning approach to superstar inventionsen_US
dc.typeThesisen_US
dc.description.degreeS.M. in Management Researchen_US
dc.contributor.departmentSloan School of Managementen_US
dc.identifier.oclc1196181684en_US
dc.description.collectionS.M.inManagementResearch Massachusetts Institute of Technology, Sloan School of Managementen_US
dspace.imported2020-11-23T19:56:09Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentSloanen_US


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