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dc.contributor.advisorRuth Rosenholtz.en_US
dc.contributor.authorShumikhin, Michael(Michael Andreevitch)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2021-01-06T19:33:38Z
dc.date.available2021-01-06T19:33:38Z
dc.date.copyright2020en_US
dc.date.issued2020en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/129227
dc.descriptionThesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, September, 2020en_US
dc.descriptionCataloged from student-submitted PDF of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 101-103).en_US
dc.description.abstractPeripheral vision is simulated using several trained generative neural networks. These networks map an image to a synthesized mongrel. A mongrel is an image simulating the visual phenomenon of crowding that a normal human would experience in the periphery. Mongrels of natural scenes and font types are explored in this thesis. These synthesized mongrels and base images were scored by feature similarity to determine an images' quantitative susceptibility to the crowding phenomenon. The quantitative measure is used to determine the most and least susceptible fonts to crowding in a large data set of fonts.en_US
dc.description.statementofresponsibilityby Michael Shumikhin.en_US
dc.format.extent103 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleQuantitative measures of crowding susceptibility in peripheral vision for large datasetsen_US
dc.typeThesisen_US
dc.description.degreeM. Eng.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1227511824en_US
dc.description.collectionM.Eng. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2021-01-06T19:33:37Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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