dc.contributor.advisor | Luca Daniel. | en_US |
dc.contributor.author | Weng, Tsui-Wei(Tsui-Wei Lily) | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2021-01-06T20:18:04Z | |
dc.date.available | 2021-01-06T20:18:04Z | |
dc.date.copyright | 2020 | en_US |
dc.date.issued | 2020 | en_US |
dc.identifier.uri | https://hdl.handle.net/1721.1/129313 | |
dc.description | Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, September, 2020 | en_US |
dc.description | Cataloged from student-submitted PDF of thesis. | en_US |
dc.description | Includes bibliographical references (pages 135-143). | en_US |
dc.description.abstract | The robustness of neural networks to adversarial examples has received great attention due to security implications. Despite various attack approaches to crafting visually imperceptible adversarial examples, little has been developed towards a comprehensive metric of robustness. This thesis is dedicated to developing several robustness quantification frameworks for deep neural networks against both adversarial and non-adversarial input perturbations, including the first robustness score CLEVER, efficient certification algorithms Fast-Lin, CROWN, CNN-Cert, and probabilistic robustness verification algorithm PROVEN. Our proposed approaches are computationally efficient and provide good quality of robustness estimates and certificates as demonstrated by extensive experiments on MNIST, CIFAR and ImageNet. | en_US |
dc.description.statementofresponsibility | by Tsui-Wei (Lily) Weng. | en_US |
dc.format.extent | 143 pages | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.title | Evaluating robustness of neural networks | en_US |
dc.type | Thesis | en_US |
dc.description.degree | Ph. D. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
dc.identifier.oclc | 1227782217 | en_US |
dc.description.collection | Ph.D. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science | en_US |
dspace.imported | 2021-01-06T20:18:02Z | en_US |
mit.thesis.degree | Doctoral | en_US |
mit.thesis.department | EECS | en_US |