| dc.contributor.advisor | Robert H. Kingston. | en_US |
| dc.contributor.author | Syz, Jing-Kai. | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. | en_US |
| dc.date.accessioned | 2021-02-02T18:54:34Z | |
| dc.date.available | 2021-02-02T18:54:34Z | |
| dc.date.copyright | 1988 | en_US |
| dc.date.issued | 1988 | en_US |
| dc.identifier.uri | https://hdl.handle.net/1721.1/129636 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. | en_US |
| dc.description | Vita. | en_US |
| dc.description | Bibliography: leaves 114-117. | en_US |
| dc.description.statementofresponsibility | by Jing-Kai Syz. | en_US |
| dc.format.extent | 118 leaves | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | MIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.title | Thermal annealing effects on boron-implanted HgCdTe diodes | en_US |
| dc.type | Thesis | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | en_US |
| dc.identifier.oclc | 18720614 | en_US |
| dc.description.collection | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1988. | en_US |
| dspace.imported | 2021-02-02T18:54:33Z | en_US |
| mit.thesis.degree | Master | en_US |
| mit.thesis.department | EECS | en_US |
