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dc.contributor.advisorLinn W. Hobbs and D. Keith Bowen.en_US
dc.contributor.authorCapano, Michael Anthony.en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Materials Science and Engineering.en_US
dc.date.accessioned2021-03-22T18:36:08Z
dc.date.available2021-03-22T18:36:08Z
dc.date.copyright1989en_US
dc.date.issued1989en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/130223
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1989.en_US
dc.descriptionIncludes bibliographical references (leaves 184-188).en_US
dc.description.statementofresponsibilityby Michael A. Capano.en_US
dc.format.extent188 leavesen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectMaterials Science and Engineering.en_US
dc.titleX-ray studies of strained overlayersen_US
dc.typeThesisen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineeringen_US
dc.identifier.oclc22351783en_US
dc.description.collectionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1989.en_US
dspace.imported2021-03-22T18:35:38Zen_US
mit.thesis.degreeDoctoralen_US
mit.thesis.departmentMatScien_US


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