| dc.contributor.advisor | Harry C. Gatos. | en_US |
| dc.contributor.author | Pollard, Edward Riley, Jr | en_US |
| dc.date.accessioned | 2005-09-21T20:54:36Z | |
| dc.date.available | 2005-09-21T20:54:36Z | |
| dc.date.issued | 1968 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/13268 | |
| dc.description | Massachusetts Institute of Technology. Dept. of Metallurgy and Materials Science. Thesis. 1968. Ph.D. | en_US |
| dc.description | Leaf no. 28 used twice. Vita. | en_US |
| dc.description | Bibliography: leaves 176-180. | en_US |
| dc.format.extent | xii, 188 leaves | en_US |
| dc.format.extent | 12221824 bytes | |
| dc.format.extent | 12221583 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Metallurgy and Materials Science | en_US |
| dc.title | Electronic properties of niobium monoxide. | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Metallurgy and Materials Science | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.identifier.oclc | 25036752 | en_US |
