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dc.contributor.authorSaathoff, Erik K. (Erik Karl)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2021-10-08T16:47:58Z
dc.date.available2021-10-08T16:47:58Z
dc.date.copyright2021en_US
dc.date.issued2021en_US
dc.identifier.urihttps://hdl.handle.net/1721.1/132798
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, February, 2021en_US
dc.descriptionCataloged from the official PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 195-198).en_US
dc.description.abstractAn inrush transient contains extensive information that permits load identification, condition monitoring, and line impedance estimation. A power system monitor's (PSM) ability to identify a load based on its inrush behavior depends on the training exemplars used to create and optimize the load identification algorithm. This work discusses the use a phase-controlled switch that can be used in situ to integrate the effects of source and line impedance into the inrush data, and to generate transients at controllable turn-on phase angles relative to the voltage line-cycle. The resulting exemplars are more realistic than those generated with conventional techniques such as testing with an AC power supply. The control over angle also enables efficient investigation of a load's transient variability space. Testing loads in fault conditions expands the variability space, allowing load identification algorithms to correctly identify faulty loads and perform diagnostics. The large, high-frequency current that inrush transients inject into the line provides excellent excitation for line impedance estimation. Previous switching based approaches focus on fitting the line impedance to a model, i.e. parametric impedance estimation. This thesis extends previous work by providing the current excitation with common electrical loads rather than using capacitors, inductors, and short circuits. Non-parametric impedance estimation is also demonstrated. Inrush transients, and other transients generated by switching the load on and off rapidly, generate current with wide-bandwidth spectral content to replace previously used sinusoidal injection sweeps.en_US
dc.description.statementofresponsibilityby Erik K. Saathoff.en_US
dc.format.extent198 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsMIT theses may be protected by copyright. Please reuse MIT thesis content according to the MIT Libraries Permissions Policy, which is available through the URL provided.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleInrush transient generation and line impedance estimationen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Scienceen_US
dc.identifier.oclc1262873708en_US
dc.description.collectionS.M. Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Scienceen_US
dspace.imported2021-10-08T16:47:58Zen_US
mit.thesis.degreeMasteren_US
mit.thesis.departmentEECSen_US


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