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dc.contributor.advisorClifton G. Fonstad.en_US
dc.contributor.authorSamson, Samuel Jonathanen_US
dc.date.accessioned2005-08-10T22:19:17Z
dc.date.available2005-08-10T22:19:17Z
dc.date.issued1972en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/13608
dc.descriptionMassachusetts Institute of Technology. Dept. of Electrical Engineering. Thesis. 1972. M.S.en_US
dc.descriptionMICROFICHE COPY ALSO AVAILABLE IN BARKER ENGINEERING LIBRARY.en_US
dc.descriptionIncludes bibliographical references.en_US
dc.format.extent62 leavesen_US
dc.format.extent2877858 bytes
dc.format.extent2877615 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineeringen_US
dc.titleElectrical properties and defect structure of stannic oxide single crystals.en_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc24182399en_US


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