dc.contributor.advisor | Clifton G. Fonstad. | en_US |
dc.contributor.author | Samson, Samuel Jonathan | en_US |
dc.date.accessioned | 2005-08-10T22:19:17Z | |
dc.date.available | 2005-08-10T22:19:17Z | |
dc.date.issued | 1972 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/13608 | |
dc.description | Massachusetts Institute of Technology. Dept. of Electrical Engineering. Thesis. 1972. M.S. | en_US |
dc.description | MICROFICHE COPY ALSO AVAILABLE IN BARKER ENGINEERING LIBRARY. | en_US |
dc.description | Includes bibliographical references. | en_US |
dc.format.extent | 62 leaves | en_US |
dc.format.extent | 2877858 bytes | |
dc.format.extent | 2877615 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | application/pdf | |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
dc.subject | Electrical Engineering | en_US |
dc.title | Electrical properties and defect structure of stannic oxide single crystals. | en_US |
dc.type | Thesis | en_US |
dc.description.degree | M.S. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 24182399 | en_US |