| dc.contributor.author | Stewart, Iain W. | |
| dc.date.accessioned | 2021-11-16T16:11:25Z | |
| dc.date.available | 2021-11-05T13:48:27Z | |
| dc.date.available | 2021-11-16T16:11:25Z | |
| dc.date.issued | 2016 | |
| dc.identifier.uri | https://hdl.handle.net/1721.1/137456.2 | |
| dc.description.abstract | © Copyright owned by the author(s) under the terms of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License (CC BY-NC-ND 4.0). A high precision calculation of the event shape DIS thrust, with next-to-next-to-next-to-leadinglogarithmic resummation and a rigorous treatment of hadronization corrections, is presented. Perturbative resummation uncertainties in the cross section are reduced to the 2% level for a significant region of the HERA phase space in x and Q, thus allowing for new accurate measurements of αs(mZ). | en_US |
| dc.description.sponsorship | Department of Energy Office of Nuclear Physics (Contract DE-FG02-94ER40818) | en_US |
| dc.language.iso | en | |
| dc.relation.isversionof | https://doi.org/10.22323/1.247.0142 | en_US |
| dc.rights | Creative Commons Attribution-NonCommercial-NoDerivs License | en_US |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | en_US |
| dc.source | Proceedings of Science | en_US |
| dc.title | A DIS event shape at N3LL | en_US |
| dc.type | Article | en_US |
| dc.identifier.citation | Stewart, Iain W. 2016. "A DIS event shape at N3LL." | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Center for Theoretical Physics | en_US |
| dc.eprint.version | Final published version | en_US |
| dc.type.uri | http://purl.org/eprint/type/ConferencePaper | en_US |
| eprint.status | http://purl.org/eprint/status/NonPeerReviewed | en_US |
| dc.date.updated | 2019-05-13T11:41:19Z | |
| dspace.orderedauthors | Kang, Daekyoung; Lee, Christopher; Stewart, Iain W. | en_US |
| dspace.date.submission | 2019-05-13T11:41:24Z | |
| mit.license | PUBLISHER_CC | |
| mit.metadata.status | Publication Information Needed | en_US |
