Deep Metric Learning via Facility Location
Author(s)
Song, Hyun Oh; Jegelka, Stefanie Sabrina; Rathod, Vivek; Murphy, Kevin
DownloadAccepted version (5.526Mb)
Open Access Policy
Open Access Policy
Creative Commons Attribution-Noncommercial-Share Alike
Terms of use
Metadata
Show full item recordAbstract
© 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based on structured prediction, that is aware of the global structure of the embedding space, and which is designed to optimize a clustering quality metric (NMI). We show state of the art performance on standard datasets, such as CUB200-2011 [37], Cars196 [18], and Stanford online products [30] on NMI and R@K evaluation metrics.
Date issued
2017-07Department
Massachusetts Institute of Technology. Computer Science and Artificial Intelligence LaboratoryPublisher
IEEE
Citation
Song, Hyun Oh, Jegelka, Stefanie, Rathod, Vivek and Murphy, Kevin. 2017. "Deep Metric Learning via Facility Location."
Version: Author's final manuscript