Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC
Author(s)
Aniceto, Raichelle; Moro, Slaven; Milanowski, Randall; Isabelle, Christopher; Hall, Norman; Vermeire, Bert; Cahoy, Kerri; ... Show more Show less
DownloadAccepted version (1.290Mb)
Terms of use
Metadata
Show full item recordAbstract
© 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si).
Date issued
2017-07Department
Massachusetts Institute of Technology. Department of Aeronautics and AstronauticsJournal
2017 IEEE Radiation Effects Data Workshop (REDW)
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Citation
Aniceto, Raichelle, Moro, Slaven, Milanowski, Randall, Isabelle, Christopher, Hall, Norman et al. 2017. "Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC."
Version: Author's final manuscript
ISBN
978-1-5090-4647-8
ISSN
2154-0535