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dc.contributor.authorAniceto, Raichelle
dc.contributor.authorMoro, Slaven
dc.contributor.authorMilanowski, Randall
dc.contributor.authorIsabelle, Christopher
dc.contributor.authorHall, Norman
dc.contributor.authorVermeire, Bert
dc.contributor.authorCahoy, Kerri
dc.date.accessioned2022-01-10T18:37:33Z
dc.date.available2021-11-09T17:39:46Z
dc.date.available2022-01-10T18:37:33Z
dc.date.issued2017-07
dc.identifier.isbn978-1-5090-4647-8
dc.identifier.issn2154-0535
dc.identifier.urihttps://hdl.handle.net/1721.1/137994.2
dc.description.abstract© 2017 IEEE. Experimental assessment of commercial 100/200 Gbps optical coherent DSP modem ASIC completed with 64 MeV and 480 MeV proton radiation test campaigns. Single event effect cross sections calculated and no performance degradation observed for proton fluence levels up to 1.27×1012 p/cm2 with equivalent total ionizing dose exposure to 170 krad(Si).en_US
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_US
dc.relation.isversionof10.1109/nsrec.2017.8115466en_US
dc.rightsCreative Commons Attribution-Noncommercial-Share Alikeen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/en_US
dc.sourceProf. Cahoy via Barbara Williamsen_US
dc.titleSingle Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASICen_US
dc.typeArticleen_US
dc.identifier.citationAniceto, Raichelle, Moro, Slaven, Milanowski, Randall, Isabelle, Christopher, Hall, Norman et al. 2017. "Single Event Effect and Total Ionizing Dose Assessment of Commercial Optical Coherent DSP ASIC."en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Aeronautics and Astronautics
dc.relation.journal2017 IEEE Radiation Effects Data Workshop (REDW)en_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/ConferencePaperen_US
eprint.statushttp://purl.org/eprint/status/NonPeerRevieweden_US
dc.date.updated2019-07-29T18:27:07Z
dspace.date.submission2019-07-29T18:27:12Z
mit.journal.volume2017en_US
mit.metadata.statusPublication Information Neededen_US


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