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dc.contributor.authorKim, Chungman
dc.contributor.authorHong, Sunghoon
dc.contributor.authorShin, Dongha
dc.contributor.authorAn, Sangmin
dc.contributor.authorZhang, Xingcai
dc.contributor.authorJhe, Wonho
dc.date.accessioned2021-12-06T13:55:22Z
dc.date.available2021-12-06T13:08:32Z
dc.date.available2021-12-06T13:55:22Z
dc.date.issued2021-12-04
dc.identifier.urihttps://hdl.handle.net/1721.1/138322.2
dc.publisherSpringer Singaporeen_US
dc.relation.isversionofhttps://doi.org/10.1007/s40820-021-00760-xen_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_US
dc.sourceSpringer Singaporeen_US
dc.titleSorting Gold and Sand (Silica) Using Atomic Force Microscope-Based Dielectrophoresisen_US
dc.typeArticleen_US
dc.identifier.citationNano-Micro Letters. 2021 Dec 04;14(1):13en_US
dc.contributor.departmentMassachusetts Institute of Technology. School of Engineeringen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2021-12-05T04:13:33Z
dc.language.rfc3066en
dc.rights.holderThe Author(s)
dspace.embargo.termsN
dspace.date.submission2021-12-05T04:13:33Z
mit.licensePUBLISHER_CC
mit.metadata.statusPublication Information Neededen_US


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