dc.contributor.advisor | Rubinfeld, Ronitt | |
dc.contributor.author | Gong, Linda | |
dc.date.accessioned | 2022-01-14T14:59:22Z | |
dc.date.available | 2022-01-14T14:59:22Z | |
dc.date.issued | 2021-06 | |
dc.date.submitted | 2021-06-17T20:13:13.599Z | |
dc.identifier.uri | https://hdl.handle.net/1721.1/139249 | |
dc.description.abstract | A classic problem in property testing is to test whether a binary input word 𝑤 is in regular language 𝐿. Such testers distinguish the case that 𝑤 is in 𝐿 from the case where 𝑤 is 𝜖-far from 𝐿 (𝜖-far means that at least 𝜖 fraction of the bits in 𝑤 must be modified to change 𝑤 into a word in 𝐿. Otherwise, 𝑤 is 𝜖-close). When it is known that 𝑤 is noisy, it can be useful to provide tolerant testers: algorithms that accept when 𝑤 is 𝛿-close and reject when 𝑤 is 𝜖-far, for 𝛿 < 𝜖. We build on the work of Alon, Krivelevich, Newman and Szegedy [1] to provide a tolerant, constant time property tester for regular languages. Our main result is that given a regular language 𝐿 ∈ {0, 1} * and an integer 𝑛, there exists a randomized algorithm which accepts a word 𝑤 of length 𝑛 if it is 𝛿-close (𝛿 < 𝜖) to a word in 𝐿 and rejects with high probability if 𝑤 is 𝜖-far from a word in 𝐿. The algorithm queries polynomial in 1 𝜖 bits in 𝑤. | |
dc.publisher | Massachusetts Institute of Technology | |
dc.rights | In Copyright - Educational Use Permitted | |
dc.rights | Copyright MIT | |
dc.rights.uri | http://rightsstatements.org/page/InC-EDU/1.0/ | |
dc.title | Tolerant Testing of Regular Languages in Sublinear Time | |
dc.type | Thesis | |
dc.description.degree | M.Eng. | |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
mit.thesis.degree | Master | |
thesis.degree.name | Master of Engineering in Electrical Engineering and Computer Science | |