MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • MIT Libraries
  • MIT Theses
  • Graduate Theses
  • View Item
  • DSpace@MIT Home
  • MIT Libraries
  • MIT Theses
  • Graduate Theses
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Deep Learning Models of Scanner/Vision Tunnel Performance in Sortation Subsystems

Author(s)
Dumont, Felix
Thumbnail
DownloadThesis PDF (2.943Mb)
Advisor
Boning, Duane S.
Golrezaei, Negin (Nicki)
Terms of use
In Copyright - Educational Use Permitted Copyright retained by author(s) https://rightsstatements.org/page/InC-EDU/1.0/
Metadata
Show full item record
Abstract
We propose an end-to-end process and tool to deep-dive scanner issues at Amazon’s sorter sites, allowing us to categorize no-reads into operational issues or actual equipment issues. Our tool sends no-read scanner images to a separate Amazon Web Services (AWS) server and post-processes them through ResNet deep learning models tuned through Bayesian optimization to appropriately assign potential fault reasons. This program will grow the team’s understanding of material handling equipment and best practices to trigger and handle exception case scenarios. A conservative entitlement is approximately $2.2MM for the pilot sites in annual savings excluding customer impact. Scanner/Vision tunnel performance at Amazon’s large crossbelt sorter sites tends to average around 80-90% read rate success, contributing to a large amount of manual rework and recirculation impacting sorter utilization. Amazon is well away from their target of 98% scanner performance for these sites. Furthermore, the mechanism to deep-dive scanner issues makes it extremely difficult to categorize them into operational issues or actual equipment issues and as a result, we have very little visibility as to no-read causes across sites and cannot properly put together a plan to improve the situation. A user-friendly interface allows site and operations managers to see which sites are lagging behind, perform a deep-dive into the root cause of the issues and test potential operational or equipment fixes.
Date issued
2021-06
URI
https://hdl.handle.net/1721.1/139395
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Sloan School of Management
Publisher
Massachusetts Institute of Technology

Collections
  • Graduate Theses

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.