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dc.contributor.advisorDavid P. Shoemaker.en_US
dc.contributor.authorKeil, John Georgeen_US
dc.date.accessioned2005-08-11T12:00:00Zen_US
dc.date.available2005-08-11T12:00:00Zen_US
dc.date.issued1968en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/13944
dc.descriptionMassachusetts Institute of Technology. Dept. of Chemistry. Thesis. 1968. Ph.D.en_US
dc.descriptionVita.en_US
dc.descriptionBibliography: leaves 111-113.en_US
dc.format.extent114 leavesen_US
dc.format.extent5865939 bytes
dc.format.extent5865696 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectChemistryen_US
dc.titleLow-energy electron diffraction surface studies of II-VI semiconductor compounds.en_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemistry
dc.identifier.oclc24986186en_US


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