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dc.contributor.advisorJin A. Kong and Robert T. Shin.en_US
dc.contributor.authorLee, Check Fuen_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2005-08-10T19:16:30Z
dc.date.available2005-08-10T19:16:30Z
dc.date.issued1990en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/14041
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1990.en_US
dc.descriptionIncludes bibliographical references (leaves 184-192).en_US
dc.description.statementofresponsibilityby Check F. Lee.en_US
dc.format.extent192 leavesen_US
dc.format.extent10060939 bytes
dc.format.extent10060696 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleFinite difference method for electromagnetic scattering problemsen_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc23292169en_US


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