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dc.contributor.authorWU, W.
dc.contributor.authorSCHAEUBLIN, R.
dc.date.accessioned2022-03-25T14:37:50Z
dc.date.available2022-02-17T16:29:44Z
dc.date.available2022-03-25T14:37:50Z
dc.date.issued2019-07
dc.date.submitted2019-04
dc.identifier.issn0022-2720
dc.identifier.issn1365-2818
dc.identifier.urihttps://hdl.handle.net/1721.1/140478.2
dc.languageen
dc.publisherWileyen_US
dc.relation.isversionofhttp://dx.doi.org/10.1111/jmi.12797en_US
dc.rightsArticle is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use.en_US
dc.sourceWileyen_US
dc.titleTEM diffraction contrast images simulation of dislocationsen_US
dc.typeArticleen_US
dc.identifier.citationWU, W. and SCHAEUBLIN, R. 2019. "TEM diffraction contrast images simulation of dislocations." Journal of Microscopy, 275 (1).en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.relation.journalJournal of Microscopyen_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.date.submission2022-02-10T17:30:07Z
mit.journal.volume275en_US
mit.journal.issue1en_US
mit.licensePUBLISHER_POLICY
mit.metadata.statusAuthority Work Neededen_US


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