dc.contributor.author | WU, W. | |
dc.contributor.author | SCHAEUBLIN, R. | |
dc.date.accessioned | 2022-03-25T14:37:50Z | |
dc.date.available | 2022-02-17T16:29:44Z | |
dc.date.available | 2022-03-25T14:37:50Z | |
dc.date.issued | 2019-07 | |
dc.date.submitted | 2019-04 | |
dc.identifier.issn | 0022-2720 | |
dc.identifier.issn | 1365-2818 | |
dc.identifier.uri | https://hdl.handle.net/1721.1/140478.2 | |
dc.language | en | |
dc.publisher | Wiley | en_US |
dc.relation.isversionof | http://dx.doi.org/10.1111/jmi.12797 | en_US |
dc.rights | Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. | en_US |
dc.source | Wiley | en_US |
dc.title | TEM diffraction contrast images simulation of dislocations | en_US |
dc.type | Article | en_US |
dc.identifier.citation | WU, W. and SCHAEUBLIN, R. 2019. "TEM diffraction contrast images simulation of dislocations." Journal of Microscopy, 275 (1). | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
dc.relation.journal | Journal of Microscopy | en_US |
dc.eprint.version | Author's final manuscript | en_US |
dc.type.uri | http://purl.org/eprint/type/JournalArticle | en_US |
eprint.status | http://purl.org/eprint/status/PeerReviewed | en_US |
dspace.date.submission | 2022-02-10T17:30:07Z | |
mit.journal.volume | 275 | en_US |
mit.journal.issue | 1 | en_US |
mit.license | PUBLISHER_POLICY | |
mit.metadata.status | Authority Work Needed | en_US |